基于机器视觉的半导体芯片表面划痕自动检测系统研发. 科学技术与创新, [S. l.], v. 3, n. 1, p. 1–5, 2026. DOI: 10.70088/kgasyp64. Disponível em: https://cn.soapubs.com/index.php/KEXUE/article/view/96. Acesso em: 7 8月. 2026.